• DocumentCode
    3209560
  • Title

    Overcoming the new design complexity barrier: Alignment of technology and business models

  • Author

    Hsu, Fu-Chieh

  • Author_Institution
    Design and Technology Platform, Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Abstract
    The semiconductor industry today faces a new design complexity barrier. Convergence of product features brings unprecedented complexities on process technology, architectural and gate-count. Integration and cost drivers bring 3-D stacking with through-silicon vias. Heterogeneity brings high-voltage devices, image sensors, and MEMS into a single product design optimization. From IP migration, to variability modeling and mitigation, to NRE cost, the new paradigm is that these are no longer discrete issues addressable by point-tool solutions. Overcoming this new design complexity barrier requires breakthrough technologies and integrated EDA solutions. Funding the development of new EDA solutions must make business sense. But while traditional ROI assessments are based on “one company-centric” business models, the next stage of the industry´s evolution requires ROI and business models that acknowledge coexistence, and even collaboration, of multiple companies. This is especially true during this unprecedented worldwide financial earthquake. A win-win-win future will depend on the emergence of an innovative business model that is realized collaboratively by key players across the IC design and manufacturing ecosystem. Fortunately, recent initiatives have the promise to meet this need.
  • Keywords
    Collaboration; Costs; Electronic design automation and methodology; Electronics industry; Image sensors; Integrated circuit modeling; Micromechanical devices; Product design; Stacking; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227218