DocumentCode :
3209764
Title :
Novel dielectric materials for future transistor generations
Author :
Bersuker, Gennadi
Author_Institution :
SEMATECH, Austin, TX
fYear :
2005
fDate :
15-15 April 2005
Firstpage :
10
Lastpage :
10
Abstract :
Summary form only given. To meet the need for higher transistor speed while keeping power consumption under control, the semiconductor industry is working to introduce high-k gate dielectrics in leading-edge transistor manufacturing processes. However, these attempts are hampered by issues with high-k device performance, which were not fully anticipated at the start of high-k development. These issues may be of intrinsic material nature, process tool related, or related to material integration within the fabrication process. In addressing this question, the fundamental factors controlling the value of dielectric constants, along with the major factors determining integration of new materials into the mainstream manufacturing, are discussed in this presentation
Keywords :
dielectric materials; manufacturing processes; transistors; dielectric constants; dielectric materials; fabrication process; high-k gate dielectrics; manufacturing processes; power consumption; semiconductor industry; transistor speed; Dielectric constant; Dielectric materials; Electronics industry; Energy consumption; Fabrication; High K dielectric materials; High-K gate dielectrics; Lead compounds; Manufacturing processes; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Electron Devices, 2005. WMED '05. 2005 IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
0-7803-9072-5
Type :
conf
DOI :
10.1109/WMED.2005.1431600
Filename :
1431600
Link To Document :
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