• DocumentCode
    3209976
  • Title

    Field emission for resonance sensing in MEMS/NEMS

  • Author

    Yang, C.K. ; Le Fèbre, A.J. ; Pandraud, G. ; van der Drift, E. ; French, P.J.

  • Author_Institution
    TU Delft, Delft
  • fYear
    2007
  • fDate
    8-12 July 2007
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    In the past decades, there is a considerable interest in the sensor community to move from micron to nano-devices, typically scaling of resonators such as cantilever beams. The scaled beams give advantages in faster response and higher sensitivity; however the detection of their resonance becomes challenging as dimensions scale down. In our work, we demonstrate the use of field emission characteristics as a detection method for scaled resonators. The advantages of using field emission are several: it is geometrically scalable without loss of signal, it has a high bandwidth and it can be integrated using standard fabrication processes.
  • Keywords
    field emission; microsensors; nanotechnology; MEMS; NEMS; cantilever beams; field emission; resonance sensing; scaled resonators; Current measurement; Data mining; Micromechanical devices; Nanoelectromechanical systems; Probes; Resonance; Resonant frequency; Sensor phenomena and characterization; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1133-7
  • Electronic_ISBN
    978-1-4244-1134-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2007.4480937
  • Filename
    4480937