Title :
A new deterministic VXI highway interconnect [for ATE applications]
Author :
Cleary, Robert T.
Author_Institution :
KineticSyst. Corp., Lockport, IL, USA
Abstract :
Programs based upon the VXIbus modular instrumentation standard are playing a significant role in test systems for both defense and commercial applications. Typical single-chassis VXI systems include an embedded computer-based controller as the system host Multi-chassis systems generally use a parallel bus or a local area network, such as Ethernet to interconnect the chassis. An important class of multi-chassis test systems requires high I/O through-put, low latency and a highly deterministic I/O response. This paper describes a new highway interconnect system that includes host computer interface options for VMEbus, EISA and PCI bus. A typical system is configured with a host interface a fiber-optic highway "loop" and slot-0 controllers in the VXI chassis. The system supports up to 126 VXI chassis, an aggregate I/O throughput of 10 megabytes per second, extremely low latency and a highly deterministic I/O response. Typical applications, including jet aircraft engine testing, missile test systems and high-performance wind tunnel data systems will be discussed.
Keywords :
aerospace engines; aircraft testing; automatic test equipment; automatic test software; avionics; computer interfaces; device drivers; military avionics; missiles; peripheral interfaces; protocols; wind tunnels; 10 Mbyte/s; CAMAC; EISA; PCI bus; VMEbus; VXIbus modular instrumentation standard; aggregate I/O throughput; deterministic VXI highway interconnect; fiber-optic highway loop; high-performance wind tunnel data systems; highly deterministic I/O response; highway protocols; host computer interface options; jet aircraft engine testing; low latency; missile test systems; slot-0 controllers; software driver; Application software; Computer networks; Concurrent computing; Control systems; Delay; Embedded computing; Instruments; LAN interconnection; Road transportation; System testing;
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
DOI :
10.1109/AUTEST.1995.522725