• DocumentCode
    3210245
  • Title

    STARC´s Semiconductor Design Technology Research Activities and the HiSIM2 Advanced MOSFET Model Project

  • Author

    Furui, Y. ; Miura-Mattausch, M. ; Sadachika, N. ; Miyake, M. ; Ezaki, T. ; mattausch, H.J. ; Ohguro, T. ; Iizuka, T. ; Inagaki, R. ; Fudanuki, N.

  • Author_Institution
    Hiroshima Univ., Hiroshima
  • fYear
    2007
  • fDate
    21-23 June 2007
  • Firstpage
    41
  • Lastpage
    46
  • Abstract
    STARC (Semiconductor Technology Academic Research Center) is a research consortium co-founded by major Japanese semiconductor companies, whose mission is to contribute to the growth of the Japanese semiconductor industry by developing leading-edge SoC design technologies. One of the achievements enabled by the academia collaboration is HiSIM (Hiroshima University STARC IGFET Model) an advanced MOSFET Model. The HiSIM2 version includes required features in modeling for the 45 nm technology node and beyond such as the STI effect. A major development is an improved model consistency, which enables even modeling of the technology variation accurately. HiSIM2 realizes both accurate and fast circuit simulation.
  • Keywords
    MOSFET; circuit simulation; integrated circuit design; integrated circuit manufacture; nanoelectronics; research and development; system-on-chip; HiSIM2 advanced MOSFET model project; Japanese semiconductor industry; STARC; Semiconductor Technology Academic Research Center; SoC design; circuit simulation; semiconductor design technology; size 45 nm; Circuit simulation; Collaboration; Companies; Consumer electronics; Electronics industry; Lead compounds; MOSFET circuits; Radio frequency; Silicon; Testing; Analog & RF application; Calculation speed; MOSFET model; STARC Consortium; Surface potential;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits and Systems, 2007. MIXDES '07. 14th International Conference on
  • Conference_Location
    Ciechocinek
  • Print_ISBN
    83-922632-9-4
  • Electronic_ISBN
    83-922632-9-4
  • Type

    conf

  • DOI
    10.1109/MIXDES.2007.4286118
  • Filename
    4286118