Emittance Scanner Optimization for Low-Energy Ion Beams

Ion beam emittances are normally measured as two-dimensional distributions of the beam current fraction within a narrow window Δx centered at position coordinate x and a narrow window Δx′ centered at trajectory angle x′. The small fraction of the beam current found within both of these windows causes the measured emittance signals to be sensitive to noise, bias, and other unwanted signals. One example of unwanted signals is slit scattering that is discussed in detail for low-energy ion beams.