• DocumentCode
    3210425
  • Title

    Absolute loss measurement of highly reflective samples by using a high Q Gaussian beam open resonator at short millimeter wave frequencies

  • Author

    Matsui, Takashi ; Kiyokawa, M. ; Araki, Kotaro

  • Author_Institution
    Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
  • fYear
    1995
  • fDate
    16-20 May 1995
  • Firstpage
    557
  • Abstract
    A high Q Gaussian beam open resonator and a new arrangement of it are described as a new method for determining absolute loss due to surface resistance of highly reflective materials at short millimeter- and submillimeter wave frequencies. The Gaussian beam open resonator consists of a pair of spherical mirrors with highly reflective partially transparent circular coupling regions and a plane minor, where the plane minor is the test sample. Application of this new method to reflection type measurement enabled simultaneous attainment of high Q factor and high signal-to-noise ratio, which would have been impossible using a conventional reflection-type open resonator with a small coupling hole. Moreover, the use of a pair of identical spherical mirrors enabled direct measurement of the Q of these mirrors, which is equal to Q/sub others/, without changing the experimental conditions. Surface loss measurements of metal films are made at 100 GHz band. In the room temperature experiment, surface resistance of 110 m/spl Omega/ was measured with an accuracy of /spl plusmn/7.6%.<>
  • Keywords
    Q-factor; electric resistance; loss measurement; millimetre wave measurement; mirrors; reflectivity; resonators; submillimetre wave measurement; 100 GHz; EHF; Q-factor; THF; absolute loss measurement; high Q Gaussian beam open resonator; high SNR; highly reflective samples; metal films; plane minor; reflection type measurement; short millimeter wave frequencies; signal-to-noise ratio; spherical mirrors; submillimeter wave frequencies; surface loss measurements; surface resistance; Electrical resistance measurement; Frequency; Loss measurement; Mirrors; Optical coupling; Optical reflection; Q measurement; Surface resistance; Surface waves; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1995., IEEE MTT-S International
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-2581-8
  • Type

    conf

  • DOI
    10.1109/MWSYM.1995.406025
  • Filename
    406025