DocumentCode
3210425
Title
Absolute loss measurement of highly reflective samples by using a high Q Gaussian beam open resonator at short millimeter wave frequencies
Author
Matsui, Takashi ; Kiyokawa, M. ; Araki, Kotaro
Author_Institution
Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
fYear
1995
fDate
16-20 May 1995
Firstpage
557
Abstract
A high Q Gaussian beam open resonator and a new arrangement of it are described as a new method for determining absolute loss due to surface resistance of highly reflective materials at short millimeter- and submillimeter wave frequencies. The Gaussian beam open resonator consists of a pair of spherical mirrors with highly reflective partially transparent circular coupling regions and a plane minor, where the plane minor is the test sample. Application of this new method to reflection type measurement enabled simultaneous attainment of high Q factor and high signal-to-noise ratio, which would have been impossible using a conventional reflection-type open resonator with a small coupling hole. Moreover, the use of a pair of identical spherical mirrors enabled direct measurement of the Q of these mirrors, which is equal to Q/sub others/, without changing the experimental conditions. Surface loss measurements of metal films are made at 100 GHz band. In the room temperature experiment, surface resistance of 110 m/spl Omega/ was measured with an accuracy of /spl plusmn/7.6%.<>
Keywords
Q-factor; electric resistance; loss measurement; millimetre wave measurement; mirrors; reflectivity; resonators; submillimetre wave measurement; 100 GHz; EHF; Q-factor; THF; absolute loss measurement; high Q Gaussian beam open resonator; high SNR; highly reflective samples; metal films; plane minor; reflection type measurement; short millimeter wave frequencies; signal-to-noise ratio; spherical mirrors; submillimeter wave frequencies; surface loss measurements; surface resistance; Electrical resistance measurement; Frequency; Loss measurement; Mirrors; Optical coupling; Optical reflection; Q measurement; Surface resistance; Surface waves; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location
Orlando, FL, USA
ISSN
0149-645X
Print_ISBN
0-7803-2581-8
Type
conf
DOI
10.1109/MWSYM.1995.406025
Filename
406025
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