DocumentCode
3210476
Title
Field emission observation of carbon nanosheet thin film by photoelectron emission microscopy (PEEM)
Author
Hou, Kun ; Kordesch, Martin E. ; Arp, Uwe ; Zhu, Mingyao ; Outlaw, Ronald A. ; Miraldo, Peter ; Holloway, Brian C. ; Manos, Dennis
Author_Institution
Coll. of William & Mary, Williamsburg
fYear
2007
fDate
8-12 July 2007
Firstpage
129
Lastpage
130
Abstract
In this study, the field emission characterization of carbon nanosheet thin film was conducted using a diode configuration with an anode-cathode distance of 254 mum. Photoelectron emission microscopy (PEEM) was used to investigate the field emission uniformity over the surfaces of carbon nanosheet thin films.
Keywords
carbon; field emission; nanostructured materials; photoelectron microscopy; thin films; C; carbon nanosheet thin film; diode configuration; distance 254 mum; field emission characterization; field emission uniformity; photoelectron emission microscopy; Carbon dioxide; Cathodes; Current measurement; Nanoscale devices; Optical films; Optical microscopy; Photoelectron microscopy; Physics; Scanning electron microscopy; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-1133-7
Electronic_ISBN
978-1-4244-1134-4
Type
conf
DOI
10.1109/IVNC.2007.4480963
Filename
4480963
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