Title :
Static Power Consumption in Nano-CMOS Circuits: Physics and Modelling
Author :
Kuzmicz, W. ; Piwowarska, E. ; Pfitzner, A. ; Kasprowicz, D.
Author_Institution :
Warsaaw Univ. of Technol., Warsaw
Abstract :
Static power consumption due to excessive leakage currents is a major problem in CMOS digital ICs with gate lengths of 90 nm and below. In this paper the physics and modelling of these currents is discussed, with special emphasis on variability and its effect on the statistical spread of the static power consumption and total power consumption.
Keywords :
CMOS digital integrated circuits; leakage currents; nanoelectronics; CMOS digital IC; leakage currents; nano-CMOS circuits; static power consumption; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Energy consumption; Leakage current; Physics; Semiconductor device modeling; Subthreshold current; Threshold voltage; Tunneling; CMOS; Leakage; Static power; Variability;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2007. MIXDES '07. 14th International Conference on
Conference_Location :
Ciechocinek
Print_ISBN :
83-922632-9-4
Electronic_ISBN :
83-922632-9-4
DOI :
10.1109/MIXDES.2007.4286142
