DocumentCode
3210855
Title
Application of a general electron emission equation to surface non-uniformity and current density variation
Author
Jensen, K.L. ; Petillo, J.J. ; Feldman, D.W. ; Montgomery, E.J. ; O´Shea, P.G. ; Moody, N.A. ; Shaw, J.L. ; Yater, J.E.
Author_Institution
Naval Res. Lab., Washington
fYear
2007
fDate
8-12 July 2007
Firstpage
167
Lastpage
168
Abstract
Using a recently developed model of emission that includes field, thermal, and photoemission effects simultaneously for arbitrary magnitudes of field, temperature, and laser intensity, we perform a study of the consequences of emission site variation on the subsequent electron beam. The electron emission model incorporated into the particle-in-cell (PIC) code MICHELLE, which is a conformal mesh finite-element (FE) two-dimensional (2-D) and 3-D electrostatic PIC code for modeling steady-state electron guns (and collectors), is described in detail.The addition of the generalized emission model therefore allows for assessing the impact of local thermal, field, and work function variation on the resultant electron beam.
Keywords
electron field emission; electron guns; finite element analysis; laser beams; photoemission; thermionic electron emission; 3-D electrostatic PIC code; MICHELLE; conformal mesh finite-element; current density variation; electron beam; electron emission equation; field effects; generalized emission model; laser intensity; particle-in-cell code; photoemission effects; steady-state electron guns; surface nonuniformity; thermal effects; two-dimensional electrostatic PIC code; Current density; Electron beams; Electron emission; Equations; Finite element methods; Iron; Laser modes; Photoelectricity; Temperature; Two dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-1133-7
Electronic_ISBN
978-1-4244-1134-4
Type
conf
DOI
10.1109/IVNC.2007.4480981
Filename
4480981
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