• DocumentCode
    3210855
  • Title

    Application of a general electron emission equation to surface non-uniformity and current density variation

  • Author

    Jensen, K.L. ; Petillo, J.J. ; Feldman, D.W. ; Montgomery, E.J. ; O´Shea, P.G. ; Moody, N.A. ; Shaw, J.L. ; Yater, J.E.

  • Author_Institution
    Naval Res. Lab., Washington
  • fYear
    2007
  • fDate
    8-12 July 2007
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    Using a recently developed model of emission that includes field, thermal, and photoemission effects simultaneously for arbitrary magnitudes of field, temperature, and laser intensity, we perform a study of the consequences of emission site variation on the subsequent electron beam. The electron emission model incorporated into the particle-in-cell (PIC) code MICHELLE, which is a conformal mesh finite-element (FE) two-dimensional (2-D) and 3-D electrostatic PIC code for modeling steady-state electron guns (and collectors), is described in detail.The addition of the generalized emission model therefore allows for assessing the impact of local thermal, field, and work function variation on the resultant electron beam.
  • Keywords
    electron field emission; electron guns; finite element analysis; laser beams; photoemission; thermionic electron emission; 3-D electrostatic PIC code; MICHELLE; conformal mesh finite-element; current density variation; electron beam; electron emission equation; field effects; generalized emission model; laser intensity; particle-in-cell code; photoemission effects; steady-state electron guns; surface nonuniformity; thermal effects; two-dimensional electrostatic PIC code; Current density; Electron beams; Electron emission; Equations; Finite element methods; Iron; Laser modes; Photoelectricity; Temperature; Two dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1133-7
  • Electronic_ISBN
    978-1-4244-1134-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2007.4480981
  • Filename
    4480981