Title :
Effective current enhancement vs. aspect ratio for rectangular ridge cathodes
Author :
Miller, R. ; Lau, Y.Y. ; Booske, J.
Author_Institution :
Univ. of Wisconsin, Madison
Abstract :
It is well known that electric fields necessary to produce appreciable electron current via field emission are on the order of Gv/m. An applied electric field is greatly enhanced in the neighborhood of sharp corners, edges, and tips, thus enabling field emission. In this work we used an analytical approach to calculate the surface field enhancement and the field emission current obtained from the "knife-edge" cathodes.
Keywords :
cathodes; electron field emission; analytical approach; aspect ratio; effective current enhancement; electron current; field emission current; knife-edge cathodes; rectangular ridge cathodes; surface field enhancement; Cathodes; Conformal mapping; Copper; Electron emission; Laboratories; Lithography; Nuclear and plasma sciences; Power engineering and energy; Robustness; Surface treatment;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
DOI :
10.1109/IVNC.2007.4480982
