DocumentCode
321091
Title
Neuron-silicon junction: electrical recordings from neural cells cultured on modified microelectronic device surfaces
Author
Offenhausser, Andreas ; Matsuzawa, Mieko ; Sprossler, C. ; Knoll, Wolfgang
Author_Institution
Max-Planck-Inst. for Polymer Res., Mainz, Germany
Volume
1
fYear
1996
fDate
31 Oct-3 Nov 1996
Firstpage
307
Abstract
A field-effect transistor (FET) array has been fabricated and used for recording of electrical signals from neural cells. The array consists of p-channel FETs with non-metallized gates. The size of the gates of the 16 FETs are from 28×12 μm2 down to 10×4 μm2 and are arranged in a 4×4 matrix on 200 μm centers. Electrical signals of neural cells can be recorded by direct coupling with the FET. In order to control the neuronal survival and growth, the microelectronic device surface is modified with a synthetic peptide linked to the surface via self-assembly techniques. It can be shown that the composition of the surface can be tuned in such a way that hippocampal neurons show good adhesion and growth for days. More importantly, these cells develop typical electrical characteristics when cultured on this artificial surface. Using this approach passive neuron FET couplings were recorded
Keywords
bioelectric phenomena; biosensors; cellular biophysics; field effect transistors; monolayers; neural nets; neurophysiology; silicon; 10 micron; 12 micron; 200 micron; 28 micron; 4 micron; FET array; Si; adhesion; artificial surface; cultured neural cells; direct coupling; electrical recordings; hippocampal neurons; modified microelectronic device surfaces; neuron-silicon junction; neuronal survival; nonmetallized gates; p-channel FET; self-assembly techniques; synthetic peptide; Cells (biology); Electrodes; Etching; FETs; Glass; Microelectronics; Neurons; Peptides; Polymers; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location
Amsterdam
Print_ISBN
0-7803-3811-1
Type
conf
DOI
10.1109/IEMBS.1996.656966
Filename
656966
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