• DocumentCode
    3210913
  • Title

    Efficient bi-level reconfiguration algorithms for fault tolerant arrays

  • Author

    Libeskind-Hadas, R. ; Shrivastava, N. ; Melhem, R.G. ; Liu, C.L.

  • Author_Institution
    Dept. of Comput. Sci., Illinois Univ., Urbana-Champaign, IL, USA
  • fYear
    1992
  • fDate
    4-6 Nov 1992
  • Firstpage
    42
  • Lastpage
    51
  • Abstract
    Considers the problem of reconfiguring processor arrays subject to computational loads that alternate between two modes. A strict mode is characterized by a heavy computational load and severe constraints on response time while a relaxed mode is characterized by a relatively light computational load and relaxed constraints on response time. In the strict mode, reconfiguration is performed by a distributed local algorithm in order to achieve fast recovery from faults. In the relaxed mode, a global reconfiguration algorithm is used to restore the system to a state that maximizes the probability that future faults occurring in subsequent strict modes will be repairable. Several new results are given for this problem. Efficient reconfiguration algorithms are described for a number of general classes of architectures. These general algorithms obviate the need for architecture-specific algorithms for architectures in these classes. It is unlikely that similar algorithms can be obtained for related classes of architectures since the reconfiguration problem for these classes is NP-complete. Finally, a general approximation algorithm is described that can be used for any architecture. Experimental results are given, suggesting that this algorithm is very effective
  • Keywords
    fault tolerant computing; reconfigurable architectures; NP-complete; approximation algorithm; bi-level reconfiguration algorithms; computational loads; distributed local algorithm; fault tolerant arrays; global reconfiguration algorithm; processor arrays; response time; Approximation algorithms; Computer architecture; Computer science; Degradation; Delay; Fault tolerance; Fault tolerant systems; Optical arrays; Runtime; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1992. Proceedings., 1992 IEEE International Workshop on
  • Conference_Location
    Dallas, TX
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-2837-5
  • Type

    conf

  • DOI
    10.1109/DFTVS.1992.224367
  • Filename
    224367