• DocumentCode
    3210945
  • Title

    Practical Si LED´s with standard CMOS technology

  • Author

    Snyman, Lukas W. ; Biber, Alice ; Aharoni, Herzl ; do Plessis, M. ; Patterson, Bruce D. ; Seitz, Peter

  • Author_Institution
    Carl & Emily Fuchs Inst. for Microelectron., Pretoria Univ., South Africa
  • fYear
    1998
  • fDate
    24-26 Apr 1998
  • Firstpage
    344
  • Lastpage
    347
  • Abstract
    Multi-junction silicon light emitting devices (Si LED´s) were designed and realised by using standard 1.2 micron and 2 micron CMOS processes with a bipolar capability and with no modifications to the processes. The designs were optimised to increase the power conversion efficiency, quantum conversion efficiency, intensity of emission and also the uniformity of emission. The devices emit light of several nW per 5 to 10 mA at 4-30 V in the 450 to 850 nm wavelength range. All the devices operated with at least one pn junction in the field emission or avalanche breakdown mode. Quantum conversion efficiencies of up to 1.5×10-8 have been measured which is two and a half orders to three orders of magnitude higher than previously published values for light emission from Si p-n avalanching junctions. Some directional light emission characteristics were also observed. The developed devices are viable for on-chip electro-optical applications and also for high speed chip-to-environment electro-optical applications
  • Keywords
    avalanche breakdown; elemental semiconductors; light emitting diodes; p-n junctions; silicon; 1.2 micron; 2 micron; 4 to 30 V; 450 to 850 nm; 5 to 10 mA; LED; Si; avalanche breakdown mode; directional light emission characteristics; field emission breakdown mode; multi-junction light emitting devices; on-chip electro-optical applications; p-n avalanching junctions; power conversion efficiency; quantum conversion efficiency; Avalanche breakdown; CMOS process; CMOS technology; Design optimization; Electrooptic devices; Power conversion; Process design; Semiconductor device measurement; Silicon; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '98. Proceedings. IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-4391-3
  • Type

    conf

  • DOI
    10.1109/SECON.1998.673367
  • Filename
    673367