• DocumentCode
    3211081
  • Title

    Evidence of electronic cooling from resonance states of nanocrystalline graphite (NCG) field emitters

  • Author

    Tao, Kevin ; Feinerman, Alan ; Busta, Heinz

  • Author_Institution
    lllinois Math. & Sci. Acad., Aurora
  • fYear
    2007
  • fDate
    8-12 July 2007
  • Firstpage
    200
  • Lastpage
    201
  • Abstract
    We have performed an experiment in which a 5mmx5mm silicon chip coated with 100nm of Ta and 100nm of NCG is placed on a thermally insulating acrylic cantilever pair. The temperature of the chip is measured with a thermistor that is glued to the bottom of the chip with silver paint. On an adjacent cantilever pair, a reference chip/thermistor is placed to monitor possible temperature changes in the vacuum chamber during the experiment. By placing the anode directly onto the NCG film, a resistance of about 140 Omega was measured and the change in temperature was recorded at different currents. From that control run, it was established that the effective resistance of the film was kOmega in the range and the cause of the heating. The small decrease in temperature around 10 muA is believed to be caused by a cooling effect since it also coincides with the onset of saturation in the I-V curve.
  • Keywords
    cantilevers; electron field emission; graphite; nanostructured materials; resonant states; silicon; tantalum; thermal insulating materials; thermistors; vacuum microelectronics; C; I-V curve; Si; Ta; current 10 muA; effective resistance; electronic cooling; nanocrystalline graphite field emitters; resistance 140 ohm; resonance states; silicon chip; silver paint; size 100 nm; size 5 mm; thermally insulating acrylic cantilever; thermistor; vacuum chamber; Electrical resistance measurement; Electronics cooling; Insulation; Paints; Resonance; Semiconductor device measurement; Silicon; Silver; Temperature; Thermistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1133-7
  • Electronic_ISBN
    978-1-4244-1134-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2007.4480994
  • Filename
    4480994