Title :
Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Cat. No.92TH0481-2)
Abstract :
The following topics are dealt with: defect and yield modeling; fault tolerant arrays; testing; concurrent error detection; system fault diagnosis; defect and fault modeling; fault tolerant systems; defect tolerance; fault tolerant arithmetics; system testing and routing for defect tolerance
Keywords :
VLSI; digital arithmetic; error detection; fault location; fault tolerant computing; system recovery; concurrent error detection; defect modeling; defect tolerance; fault modeling; fault tolerant arithmetics; fault tolerant arrays; fault tolerant systems; routing; system fault diagnosis; system testing; yield modeling;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1992. Proceedings., 1992 IEEE International Workshop on
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-8186-2837-5
DOI :
10.1109/DFTVS.1992.224398
