Title :
Evaluation of Surface Charge Density with Electrostatic Voltmeter - Measurement Geometry Considerations
Author :
Noras, Maciej A. ; Pandey, Apra
Author_Institution :
Dept. of Eng. Technol., Univ. of North Carolina at Charlotte, Charlotte, NC
Abstract :
Use and limitations of Kelvin probe based instruments for surface charge density measurements of dielectric materials are discussed. Three different devices are evaluated: a DC feedback electrostatic voltmeter (ESVM), an AC feedback ESVM and a fieldmeter. Special attention is paid to influence of geometry of the measured object. The effect of viewing angle of the probe, thickness of the sample as well as of stray capacitances are shown theoretically and verified experimentally.
Keywords :
density measurement; dielectric materials; surface charging; voltmeters; DC feedback; Kelvin probe; dielectric materials; electrostatic voltmeter; fieldmeter; measurement geometry; stray capacitances; surface charge density measurements; Charge measurement; Current measurement; Density measurement; Dielectric measurements; Electrostatic measurements; Feedback; Geometry; Kelvin; Probes; Voltmeters;
Conference_Titel :
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location :
Edmonton, Alta.
Print_ISBN :
978-1-4244-2278-4
Electronic_ISBN :
0197-2618
DOI :
10.1109/08IAS.2008.108
