DocumentCode :
3211253
Title :
Field emission to control nanometer tip-medium distances in probe storage
Author :
Le Fèbre, Alexander ; Abelmann, L. ; Lodder, J.C.
Author_Institution :
MESA+ Inst. for Nanotechnology, Enschede
fYear :
2007
fDate :
8-12 July 2007
Firstpage :
223
Lastpage :
224
Abstract :
In this work, we present a novel concept for high resolution proximity sensing based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation. This study is focused on tip-medium distance control, and the aim is to apply this method in a vacuum probe storage device where thousands of field emission probes In this work, we present a novel concept for high resolution proximity sensing based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation. This study is focused on tip-medium distance control, and the aim is to apply this method in a vacuum probe storage device where thousands of field emission probes were individually positioned at several nanometers above a storage medium.
Keywords :
data recording; digital storage; field emission; nanotechnology; field emission; nanometer tip-medium distance control; proximity sensing; vacuum condition; vacuum probe storage device; Coatings; Current measurement; Displacement measurement; Magnetic field measurement; Magnetic resonance; Nanotechnology; Probes; Silicon; Stability; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
Type :
conf
DOI :
10.1109/IVNC.2007.4481005
Filename :
4481005
Link To Document :
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