Field emission to control nanometer tip-medium distances in probe storage

Author

Le Fèbre, Alexander ; Abelmann, L. ; Lodder, J.C.

Author_Institution

MESA+ Inst. for Nanotechnology, Enschede

fYear

2007

fDate

8-12 July 2007

Firstpage

223

Lastpage

224

Abstract

In this work, we present a novel concept for high resolution proximity sensing based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation. This study is focused on tip-medium distance control, and the aim is to apply this method in a vacuum probe storage device where thousands of field emission probes In this work, we present a novel concept for high resolution proximity sensing based on field emission and provide more insight in the vacuum conditions and electronics needed for stable operation. This study is focused on tip-medium distance control, and the aim is to apply this method in a vacuum probe storage device where thousands of field emission probes were individually positioned at several nanometers above a storage medium.

Keywords

data recording; digital storage; field emission; nanotechnology; field emission; nanometer tip-medium distance control; proximity sensing; vacuum condition; vacuum probe storage device; Coatings; Current measurement; Displacement measurement; Magnetic field measurement; Magnetic resonance; Nanotechnology; Probes; Silicon; Stability; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International

Conference_Location

Chicago, IL

Print_ISBN

978-1-4244-1133-7

Electronic_ISBN

978-1-4244-1134-4

Type

conf

DOI

10.1109/IVNC.2007.4481005

Filename

4481005