Title :
Processing electrotactile signals: relationship of speed to intelligence
Author :
Szeto, Andrew Y.J. ; Lin, Deirchow ; Saccuzzo, Dennis P.
Author_Institution :
Dept. of Electr. & Comput. Eng., San Diego State Univ., CA, USA
fDate :
31 Oct-3 Nov 1996
Abstract :
Individual differences in their speed of tactile information processing were investigated in 12 male subjects by applying an electrotactile mask at various time intervals before and after the presentation of an electrotactile stimulus. An IBM PC generated both the electrocutaneous stimulus and the mask. The tactile display consisted of four concentric silver electrodes that were held against a subject´s abdominal skin surface. The stimulus signal was applied to one of these electrodes whereas the mask was applied simultaneously to all four electrodes. The pilot study found a significant correlation between a subject´s tactile information processing speed (as measured by how closely the mask could be applied in time to the stimulus without noticeable effects) and his intelligence as measured using the Raven Progressive Matrices Test
Keywords :
bioelectric phenomena; covariance analysis; human factors; mechanoception; medical signal processing; neurophysiology; visual perception; Raven Progressive Matrices Test; abdominal skin surface; backward masking; cognitive processes; concentric silver electrodes; critical interstimulus duration; critical stimulus duration; electrocutaneous stimulus; electrotactile mask; electrotactile signals processing; electrotactile stimulus; forward masking; iconic storage; individual differences; intelligence role; multivariate analysis of variance; processing speed; tactile display; tactile information processing; tactile sense; tactonic storage; Abdomen; Displays; Electrodes; Information processing; Signal processing; Silver; Skin; Testing; Time measurement; Velocity measurement;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.657016