• DocumentCode
    3211416
  • Title

    Thermionic electron emission from diamond by nano-seconds laser heating

  • Author

    Choi, B.K. ; Kang, W.P. ; Davis, I.L. ; Davidson, J.L. ; Hu, S.T. ; Pitz, R.W.

  • Author_Institution
    Vanderbilt Univ., Nashville
  • fYear
    2007
  • fDate
    8-12 July 2007
  • Firstpage
    243
  • Lastpage
    244
  • Abstract
    Investigating a vacuum thermionic emission behavior of a CVD diamond film on silicon substrate is reported. Under vacuum conditions and subjected to a moderate voltage bias, the bare silicon and diamond coated silicon samples show emission current pulses synchronized with excitation nano seconds 532 nm Nd:YAG pulsed laser. Nano second laser is applied to back side of the substrate and the emission site is screened from laser excitations. As increasing the pulse laser intensity, peak emission current increases monotonically. The Arrhenious plot of the peak emission current and the pulse laser intensity relationship follows Richardson´s thermionic emission equation in the bare silicon sample. The diamond-coated sample shows two activation energies: one is the same as silicon and the other shows zero activation energy.
  • Keywords
    CVD coatings; diamond; elemental semiconductors; laser materials processing; neodymium; semiconductor thin films; silicon; solid lasers; thermionic electron emission; vacuum techniques; Arrhenious plot; C; CVD diamond film; Richardson´s thermionic emission equation; Si; YAG:Nd; bare silicon sample; diamond coated silicon samples; emission current pulses; laser excitations; nanoseconds laser heating; peak emission current; pulsed laser intensity; silicon substrate; thermionic electron emission; vacuum thermionic emission behavior; wavelength 532 nm; Electron emission; Heating; Laser excitation; Laser modes; Optical pulses; Pulsed laser deposition; Semiconductor films; Silicon; Substrates; Thermionic emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1133-7
  • Electronic_ISBN
    978-1-4244-1134-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2007.4481014
  • Filename
    4481014