Title :
A practical approach for the diagnosis of a MIMD network
Author :
Aktouf, Ch ; Mazaré, G. ; Robach, Ch ; Velazco, R.
Author_Institution :
IMAG/LGI, Grenoble, France
Abstract :
The authors present a self-diagnosis approach for validating a MIMD fine grain network. Based on a simple fault model, the authors propose an O(n2) self diagnosis algorithm which is executed in a pipeline fashion. The functional test program of the processors together with simulation results are given
Keywords :
automatic testing; built-in self test; computer testing; fault location; microprocessor chips; parallel architectures; pipeline processing; MIMD network; VLSI; asymmetric model; fault model; functional test program; self-diagnosis; simulation; symmetric model; Arithmetic; Circuit faults; Circuit testing; Computational modeling; Distributed algorithms; Fault diagnosis; Large-scale systems; Multiprocessing systems; System testing; Very large scale integration;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224411
