DocumentCode
3211662
Title
Positive photon discrimination for ultra low voltage IC analysis
Author
Desplats, Romain ; Remmach, Mustapha ; Faggion, Gael ; Beaudoin, Felix ; Perdu, Philippe ; Leibowitz, Marty ; Sanchez, Kevin ; Guilaume, Sam ; Lundquis, Ted ; Lewis, Dean
Author_Institution
Thales Lab., CNES, Toulouse, France
fYear
2004
fDate
25-29 April 2004
Firstpage
361
Lastpage
369
Abstract
IC Debug is facilitated with Time Resolved Photon Emission, but acquisition times become unacceptably long at IC power supply voltages of <1V. Positive photon discrimination greatly reduces acquisition time by rapidly extracting switching events from the background noise.
Keywords
integrated circuit reliability; integrated circuit testing; IC Debug; Time Resolved Photon Emission; acquisition time; acquisition times; background noise; positive photon discrimination; rapidly extracting switching events; ultra low voltage IC analysis; Background noise; Electron emission; Event detection; FETs; Hot carriers; Low voltage; Photonic integrated circuits; Power supplies; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Print_ISBN
0-7803-8315-X
Type
conf
DOI
10.1109/RELPHY.2004.1315353
Filename
1315353
Link To Document