Title :
Spectral Modification of the LFSR - Sequence for Test Patterns Generation Improvement
Author :
Porwik, P. ; Wróbel, K.
Author_Institution :
Univ. of Silesia, Katowice
Abstract :
In the paper some modification of the LFSR sequences was proposed. Modified, predictable test pattern sequences are estimated on the basis of spectral analysis of the past sequences. Experimental results show that the number of the test vectors can be significantly reduced if classical LFSR register approach by spectral analysis will be aided. Obtained results of benchmarks circuits testing demonstrate the effectiveness of the proposed technique in which high fault coverage was achieved.
Keywords :
automatic test pattern generation; benchmark testing; binary sequences; integrated circuit testing; spectral analysis; LFSR register approach; LFSR sequences; VLSI; Walsh functions; benchmarks circuits testing; fault coverage; linear feedback shift register; predictable test pattern sequences estimation; spectral analysis; test patterns generation; Automatic test pattern generation; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Polynomials; Registers; Spectral analysis; State feedback; Test pattern generators; Circuits testing; Faults coverage; LFSR technique; Spectral analysis; Test patterns; Walsh functions;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2007. MIXDES '07. 14th International Conference on
Conference_Location :
Ciechocinek
Print_ISBN :
83-922632-9-4
Electronic_ISBN :
83-922632-9-4
DOI :
10.1109/MIXDES.2007.4286221
