Title :
Localization and aftereffect of automatic test generation
Author :
Li, Zhongcheng ; Pan, Yuqi ; Min, Yinghua
Abstract :
Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm
Keywords :
VLSI; automatic testing; combinatorial circuits; fault location; integrated logic circuits; logic testing; performance evaluation; SABATPG; VLSI; aftereffect; automatic test generation; benchmark circuits; combinational circuits; computing time; identified undetectable faults; localization; partial implication; shared sensitization; test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Computers; Fault diagnosis; Fault tolerance; Laboratories; System testing;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224440
