Localization and aftereffect of automatic test generation

Author

Li, Zhongcheng ; Pan, Yuqi ; Min, Yinghua

fYear

1992

fDate

26-27 Nov 1992

Firstpage

82

Lastpage

87

Abstract

Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm

Keywords

VLSI; automatic testing; combinatorial circuits; fault location; integrated logic circuits; logic testing; performance evaluation; SABATPG; VLSI; aftereffect; automatic test generation; benchmark circuits; combinational circuits; computing time; identified undetectable faults; localization; partial implication; shared sensitization; test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Computers; Fault diagnosis; Fault tolerance; Laboratories; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)

Conference_Location

Hiroshima

Print_ISBN

0-8186-2985-1

Type

conf

DOI

10.1109/ATS.1992.224440

Filename

224440