Functional tests for arbitration SRAM-type FIFOs

First-In-First-Out (FIFO) memories are becoming increasingly popular as buffer storage between subsystems operating at different data rates. One way to implement a FIFO is to use a single-port SRAM memory with arbitration logic to resolve conflicts due to simultaneous read and write requests. The well-know functional tests for SRAMs (van de Goor, 1990 and 1991) cannot be applied to FIFOs because of their built in access restrictions. Functional fault models and functional tests for FIFOs are presented before, together with a set of tests and their correctness proofs for arbitration SRAM-type FIFOs