• DocumentCode
    3212069
  • Title

    Issues in fault modelling and testing of micropipelines

  • Author

    Pagey, Sandeep ; Sherlekar, S.D. ; Venkatesh, G.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
  • fYear
    1992
  • fDate
    26-27 Nov 1992
  • Firstpage
    107
  • Lastpage
    111
  • Abstract
    Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits
  • Keywords
    combinatorial circuits; computer testing; fault location; logic testing; pipeline processing; protocols; C-element; asynchronous implementation; asynchronous protocols; combinational circuits; fault modelling; logic testing; micropipelines; pipelined circuits; test pattern generation; two-pattern test; Circuit faults; Circuit testing; Combinational circuits; Delay; Latches; Logic circuits; Logic testing; Pipelines; Switches; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
  • Conference_Location
    Hiroshima
  • Print_ISBN
    0-8186-2985-1
  • Type

    conf

  • DOI
    10.1109/ATS.1992.224446
  • Filename
    224446