DocumentCode
3212069
Title
Issues in fault modelling and testing of micropipelines
Author
Pagey, Sandeep ; Sherlekar, S.D. ; Venkatesh, G.
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Bombay, India
fYear
1992
fDate
26-27 Nov 1992
Firstpage
107
Lastpage
111
Abstract
Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits
Keywords
combinatorial circuits; computer testing; fault location; logic testing; pipeline processing; protocols; C-element; asynchronous implementation; asynchronous protocols; combinational circuits; fault modelling; logic testing; micropipelines; pipelined circuits; test pattern generation; two-pattern test; Circuit faults; Circuit testing; Combinational circuits; Delay; Latches; Logic circuits; Logic testing; Pipelines; Switches; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location
Hiroshima
Print_ISBN
0-8186-2985-1
Type
conf
DOI
10.1109/ATS.1992.224446
Filename
224446
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