DocumentCode
3212128
Title
Methods to measure and to enhance the testability of behavioral descriptions of digital circuits
Author
Santucci, Jean-Francois ; Dray, Gérard ; Boumédine, Marc ; Giambiasi, Norbert
Author_Institution
L.E.R.I., Nimes, France
fYear
1992
fDate
26-27 Nov 1992
Firstpage
118
Lastpage
123
Abstract
The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions
Keywords
digital integrated circuits; integrated circuit testing; logic testing; behavioral descriptions; controllability; cost; digital circuits; internal modelling; observability; test pattern generation; testability; Automatic testing; Circuit faults; Circuit testing; Costs; Digital circuits; Electronic mail; Out of order; Process design; Signal design; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location
Hiroshima
Print_ISBN
0-8186-2985-1
Type
conf
DOI
10.1109/ATS.1992.224448
Filename
224448
Link To Document