Title :
A method for measuring substrate noise in the UWB frequency band on lightly doped substrates
Author :
Shen, Ming ; Tong, Tian ; Mikkelsen, Jan Hvolgaard ; Larsen, Torben
Author_Institution :
Aalborg Univ., Aalborg
Abstract :
A measurement method for characterizing the substrate noise over the ultra-wideband (UWB) frequency band in UWB systems implemented using lightly doped CMOS processes is presented. The measurement structure in this method is based on modified ground-signal-ground (GSG) pads. In addition, the effects of the distance-based substrate resistance and the capacitive coupling between the substrate and the ground of the measurement setup are evaluated by on-wafer measurement of a test chip fabricated in a 0.18 mum lightly doped CMOS process. An equivalent circuit model of the presented measurement structure is given and shows accurate fit. From the measurement results the presented method is shown to provide a measurement band from 3 GHz to 10 GHz. To further validate the usability of the method a practical class-E PA is used.
Keywords :
CMOS integrated circuits; noise measurement; substrates; ultra wideband technology; UWB system; capacitive coupling; complementary metal-oxide-semiconductor; distance-based substrate resistance; doped CMOS process; doped substrate; equivalent circuit model; ground-signal-ground; on-wafer measurement; substrate noise characterization; substrate noise measurement; ultra-wideband frequency band; CMOS process; Circuit testing; Coupling circuits; Electrical resistance measurement; Equivalent circuits; Frequency measurement; Noise measurement; Optical coupling; Semiconductor device measurement; Ultra wideband technology; UWB; substrate noise; wide band measurements;
Conference_Titel :
Norchip, 2007
Conference_Location :
Aalborg
Print_ISBN :
978-1-4244-1516-8
Electronic_ISBN :
978-1-4244-1517-5
DOI :
10.1109/NORCHP.2007.4481057
