• DocumentCode
    3212677
  • Title

    Considerations When Applying Microprocessor Relays In Chemically Harsh Environments

  • Author

    Wester, Craig ; Midence, Rene ; Cosoreanu, Claudia

  • Author_Institution
    GE Multilin, Norcross
  • fYear
    2007
  • fDate
    24-28 June 2007
  • Firstpage
    19
  • Lastpage
    24
  • Abstract
    The evolution of microprocessor based protection, monitoring, and control devices in industrial applications has resulted from a need for smaller, more cost effective protection devices that can provide substantially more metering, monitoring, and reporting functionality than electro-mechanical or solid-state relays. These requirements have led to the use of surface mount components, replacing the larger, more expensive through-hole components. While helping to meet the requirements of the industrial market, the use of surface mount (SMT) technology has produced technical challenges directly related to the industrial environment for which they were designed. Harsh chemical environments, specifically environments that contain gaseous sulphide, can result in the corrosion and ultimate failure of the surface mount components used to manufacture microprocessor-based devices. Although the terminology "Harsh Chemical Environment" is commonly used to describe applications known to contain chemical contamination, it has been established that the levels of hydrogen sulphide (H2S) required to cause failures in surface mount components is scientifically lower than previously thought. This paper will serve to highlight the technical challenges associated with implementing microprocessor-based devices in industrial environments where there is the potential for hydrogen sulphide or other corrosive gas contamination. Among the issues to be discussed; (a) how hydrogen sulphide effects microprocessor based devices; (b) sources and levels of hydrogen sulphide causing component failure; and (c) prevention and containment solutions for industrial applications.
  • Keywords
    contamination; corrosion; failure analysis; hydrogen compounds; relay protection; surface mount technology; chemical contamination; chemically harsh environments; component failure; corrosion; gaseous sulphide; hydrogen sulphide; microprocessor relays; protection devices; surface mount components; surface mount technology; ultimate failure; Chemicals; Hydrogen; Manufacturing industries; Microprocessors; Monitoring; Protection; Protective relaying; Relays; Surface contamination; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulp and Paper Industry Technical Conference, 2007. Conference Record of Annual
  • Conference_Location
    Williamsburg, VA
  • ISSN
    0190-2172
  • Print_ISBN
    1-4244-1192-0
  • Electronic_ISBN
    0190-2172
  • Type

    conf

  • DOI
    10.1109/PAPCON.2007.4286279
  • Filename
    4286279