Title :
Standby current prediction model for microprocessors reliability risk assessment
Abstract :
A model for ULSI circuit´s standby current prediction is presented and discussed. The viability of the model is examined on 32-bit 0.13 μm benchmark microprocessors actual data.
Keywords :
ULSI; current distribution; integrated circuit modelling; integrated circuit reliability; 0.13 micron; ULSI circuit´s standby current prediction; microprocessors reliability risk assessment; standby current prediction model; Circuits; Conductivity; Current measurement; MOSFETs; Manufacturing processes; Microprocessors; Predictive models; Risk management; Semiconductor device measurement; Semiconductor device modeling;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Print_ISBN :
0-7803-8315-X
DOI :
10.1109/RELPHY.2004.1315432
