DocumentCode
3213138
Title
Standby current prediction model for microprocessors reliability risk assessment
Author
Lisenker, Boris
fYear
2004
fDate
25-29 April 2004
Firstpage
647
Lastpage
648
Abstract
A model for ULSI circuit´s standby current prediction is presented and discussed. The viability of the model is examined on 32-bit 0.13 μm benchmark microprocessors actual data.
Keywords
ULSI; current distribution; integrated circuit modelling; integrated circuit reliability; 0.13 micron; ULSI circuit´s standby current prediction; microprocessors reliability risk assessment; standby current prediction model; Circuits; Conductivity; Current measurement; MOSFETs; Manufacturing processes; Microprocessors; Predictive models; Risk management; Semiconductor device measurement; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Print_ISBN
0-7803-8315-X
Type
conf
DOI
10.1109/RELPHY.2004.1315432
Filename
1315432
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