Title :
Effective error diagnosis for RTL designs in HDLs
Author :
Jiang, Tai-Ying ; Liu, Chien-Nan Jimmy ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
We propose an effective approach to diagnose multiple design errors in HDL designs with only one erroneous test case. Error candidates will be greatly reduced while ensuring that true erroneous statements are included in. The probability of correctness for each potential erroneous statement will be estimated such that the most suspected statements are reported first. Experiments show that the size of error candidates is indeed small and the estimation for the probability of correctness for potential error candidates is accurate.
Keywords :
VLSI; data flow graphs; errors; hardware description languages; integrated circuit design; logic CAD; probability; HDL designs; RTL designs; VLSI circuit designs; automatic design error diagnosis; control DFG; multiple design errors; probability; Boolean functions; Circuit simulation; Circuit synthesis; Design engineering; Electronic equipment testing; Error correction; Hardware design languages; Process design; State estimation; Very large scale integration;
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Print_ISBN :
0-7695-1825-7
DOI :
10.1109/ATS.2002.1181738