• DocumentCode
    3213240
  • Title

    Hierarchical fault simulation using behavioral and gate level hardware models

  • Author

    Mirkhani, Shahrzad ; Lavasani, Meisam ; Navabi, Zainalabedin

  • Author_Institution
    Electr. & Comput. Eng., Tehran Univ., Iran
  • fYear
    2002
  • fDate
    18-20 Nov. 2002
  • Firstpage
    374
  • Lastpage
    379
  • Abstract
    This paper presents a fault simulation environment that takes advantage of available models at the behavioral and gate levels of abstraction. The simulation takes place in VHDL and for fault simulation, special VHDL models are written that are capable of propagating circuit faults. Behavioral VHDL models propagate fault effects that appear on their input ports; in addition to this, gate level VHDL models are capable of injecting faults on their output lines. The fault simulation environment assumes the existence of the gate level and behavioral models for every component, and uses the appropriate model depending on whether a fault belongs to it or another component. A wrapper simulation model that encloses both models of a component switches automatically between the models. The wrapper takes care of feedback in the sequential circuits by always selecting the gate level of a component for propagating its own faults. This environment fits well with the hardware description language settings in which pre-synthesis behavioral models, post-synthesis gate-level models and a mixed simulation environment are available. The paper shows a mathematical analysis illustrating the performance improvement of this method over the traditional gate-level fault simulation.
  • Keywords
    fault simulation; hardware description languages; integrated circuit design; logic CAD; sequential circuits; behavioral VHDL models; behavioral level hardware models; circuit faults; gate level VHDL models; gate level hardware models; hardware description language; hierarchical fault simulation environment; sequential circuits; wrapper simulation model; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Hardware design languages; Mathematical analysis; Sequential circuits; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1825-7
  • Type

    conf

  • DOI
    10.1109/ATS.2002.1181740
  • Filename
    1181740