Title :
Vector memory expansion system for T33XX logic tester
Author :
Yamada, Kazuhiro ; Takahashi, Yoshikazu
Author_Institution :
Semicond. Test Eng., IBM Japan Ltd., Shiga, Japan
Abstract :
This paper describes a low-cost memory expansion system for the Advantest T33XX logic tester series. Using this system, the T33XX tester has the same capability as the T6672 tester. This system allows the T33XX to be used for ASIC wafer testing until 2010.
Keywords :
VLSI; application specific integrated circuits; automatic test equipment; integrated circuit testing; integrated logic circuits; large scale integration; logic testing; memory expansion boards; ASIC wafer testing; Advantest T33XX logic tester series; logic LSI chips; low-cost memory expansion system; vector memory expansion system; Clocks; Computer buffers; Large scale integration; Logic testing; Pins; Semiconductor device testing; Sequential analysis; System testing; Test pattern generators; Timing;
Conference_Titel :
Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
Print_ISBN :
0-7695-1825-7
DOI :
10.1109/ATS.2002.1181743
