• DocumentCode
    3213307
  • Title

    Core-clustering based SoC test scheduling optimization

  • Author

    Huang, Yu ; Reddy, Sudhakar M. ; Cheng, Wu-Tung

  • Author_Institution
    Mentor Graphics Corp., Wilsonville, OR, USA
  • fYear
    2002
  • fDate
    18-20 Nov. 2002
  • Firstpage
    405
  • Lastpage
    410
  • Abstract
    In this paper, a method is presented to schedule tests for core-based SoCs to achieve optimal test completion time for the SoC design by simultaneously determining optimal core clustering, core cluster wrapper width, and pin mapping. For the first time the above mentioned techniques are applied concurrently to solve the SoC test scheduling problem. A heuristic algorithm implementing these techniques to determine an optimal solution is proposed.
  • Keywords
    automatic testing; bin packing; integrated circuit testing; logic testing; optimisation; scheduling; system-on-chip; SoC test scheduling optimization; core cluster wrapper width; core-clustering based SoCs; heuristic algorithm; optimal core clustering; optimal test completion time; pin mapping; Cities and towns; Clustering algorithms; Energy consumption; Graphics; Heuristic algorithms; Job shop scheduling; Pins; Processor scheduling; Tellurium; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1825-7
  • Type

    conf

  • DOI
    10.1109/ATS.2002.1181745
  • Filename
    1181745