DocumentCode
3213348
Title
Long Term Reverse Annealing In Silicon Detectors And First Results Of DLTS - And Current Pulse Shape Measurements
Author
Feick, H. ; Fretwurst, E. ; Kanitz, S. ; Lindström, G. ; Mahlmann, K.H. ; Meyer, G. ; Schulz, T.
Author_Institution
Universitit Hamburg
fYear
1993
fDate
31 Oct-6 Nov 1993
Firstpage
348
Lastpage
352
Keywords
Annealing; Current measurement; Detectors; Impurities; Optical pulse generation; Pulse measurements; Pulse shaping methods; Shape measurement; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN
0-7803-1487-5
Type
conf
DOI
10.1109/NSSMIC.1993.701689
Filename
701689
Link To Document