DocumentCode :
3213348
Title :
Long Term Reverse Annealing In Silicon Detectors And First Results Of DLTS - And Current Pulse Shape Measurements
Author :
Feick, H. ; Fretwurst, E. ; Kanitz, S. ; Lindström, G. ; Mahlmann, K.H. ; Meyer, G. ; Schulz, T.
Author_Institution :
Universitit Hamburg
fYear :
1993
fDate :
31 Oct-6 Nov 1993
Firstpage :
348
Lastpage :
352
Keywords :
Annealing; Current measurement; Detectors; Impurities; Optical pulse generation; Pulse measurements; Pulse shaping methods; Shape measurement; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
Type :
conf
DOI :
10.1109/NSSMIC.1993.701689
Filename :
701689
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3213348
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