Title :
Outstanding Paper Award - Impact of negative bias temperature instability on digital circuit reliability
Abstract :
The award winners and the titles of their award winning papers are listed.
Conference_Titel :
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-8315-X
DOI :
10.1109/RELPHY.2004.1315476
