DocumentCode
3214642
Title
Simulation study of complex action potential conduction in atrioventricular node
Author
Inada, Shin ; Ono, Takahito ; Shibata, Naotaka ; Iwata, M. ; Haraguchi, Ryo ; Ashihara, Takashi ; Mitsui, Kazuki ; Boyett, M.R. ; Dobrzynski, Halina ; Nakazawa, K.
Author_Institution
Nat. Cerebral & Cardiovascular Center, Suita, Japan
fYear
2013
fDate
3-7 July 2013
Firstpage
6850
Lastpage
6853
Abstract
The atrioventricular (AV) node, which is located between the atria and ventricles of the heart, acts as important roles in cardiac excitation conduction between the two chambers. Although there are multiple conduction pathways in the AV node, the structure of the AV node has not been clarified. In this study, we constructed a one-dimensional model of the AV node and simulated excitation conduction between the right atrium and the bundle of His via the AV node. We also investigated several characteristics of the AV node: (1) responses of the AV node to high-rate excitation in the right atrium, (2) the AV nodal reentrant beat induced by premature stimulus, and (3) ventricular rate control during atrial fibrillation with various methods. Our simulation results suggest that multiple conduction pathways act as important roles in controlling the ventricular rate. The one-dimensional model constructed in this study may be useful to analyze complex conduction patterns in the AV node.
Keywords
bioelectric potentials; diseases; electrocardiography; medical signal processing; AV nodal reentrant beat; His bundle; atrial fibrillation; atrioventricular node; cardiac excitation conduction; chambers; complex action potential conduction; electrocardiography; heart; high-rate excitation; multiple conduction pathways; one-dimensional model; premature stimulus; right atrium; simulated excitation conduction; ventricles; ventricular rate control; Biological system modeling; Educational institutions; Heart beat; Muscles; Rabbits; Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location
Osaka
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2013.6611131
Filename
6611131
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