DocumentCode
3215336
Title
Current controlled magnetic AND/OR logic circuit
Author
Ding, Qing-An ; Xu, Yong Bing
Author_Institution
Dept. of Electron., Univ. of York, York, UK
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
605
Lastpage
606
Abstract
Logic gates are important as they are indispensable devices to all the electronic products. Controlling magnetization directly with an electric current rather than a magnetic field is one of the recent developments within spintronics. The magnetic logic operations are performed by domain wall propagation through ferromagnetic nanowire junctions, resulting in magnetization reversal. This domain wall propagation in the magnetic logic has been induced by an external applied field, which prevents the use of the voltage and current to control the logic operations. A potential alternative is current-induced dragging of a domain wall, which does not rely on a generated magnetic field. An AND/OR gate is a three-terminal device, made up of two input nanowires with constriction meeting at a junction region. The device is exposed by the electron beam with the SEM machine on a Si substrate. The logic function for a two-input gate is realized through the domain wall motion. To realize the OR function, critical current of the input constriction must be larger than that of the output constriction, this means that the constriction width of the input wire must be larger than that of the output wire. To realize the AND function, the width of both input constrictions must be smaller than that of output constrictions.
Keywords
ferromagnetism; logic circuits; logic gates; magnetic domain walls; magnetisation reversal; nanoelectronics; nanowires; scanning electron microscopy; AND function; AND gate; OR function; OR gate; SEM; Si; Si substrate; controlled magnetic AND logic circuit; controlled magnetic OR logic circuit; current-induced dragging; domain wall motion; domain wall propagation; electron beam; ferromagnetic nanowire junctions; logic function; logic gates; magnetic logic operations; magnetization reversal; two-input gate; Magnetic resonance imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644159
Filename
5644159
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