• DocumentCode
    3215901
  • Title

    Automatic minimization of eye blink artifacts using fractal dimension of independent components of multichannel EEG

  • Author

    Samavati, Mehdi ; Nasrabadi, Ali Motie ; Mohammadi, Mohammad Reza

  • Author_Institution
    Shahed Univ., Tehran, Iran
  • fYear
    2012
  • fDate
    15-17 May 2012
  • Firstpage
    1576
  • Lastpage
    1578
  • Abstract
    Eye blink artifact is an important artifact in EEG recordings that should be corrected before any other analysis in clinical or brain computer interface purposes. This artifact cannot be removed by frequency selective filters, because of its frequency overlap with EEG. Independent component analysis (ICA) is an effective method that can separate ocular source from brain sources. The main problem in ICA is to recognize components related to ocular artifact source, automatically. In recent years, some methods have been proposed to recognize these components based on some features of independent components. In this work, we use Higuchi´s fractal dimension of independent components, because of the difference between fractal structure of the ocular and brain sources. The method has been tested by EEG data recorded for diagnose attention deficit/hyperactivity disorder (ADHD) in children. The results show that the proposed method is appropriate for automatic minimization of eye blink artifact.
  • Keywords
    brain-computer interfaces; electroencephalography; eye; independent component analysis; medical disorders; medical signal processing; neurophysiology; vision; EEG data; EEG recordings; Higuchis fractal dimension; ICA; attention defacit-hyperactivity disorder; automatic minimization; brain computer interface purposes; brain sources; eye blink artifacts; fractal dimension; fractal structure; frequency selective filters; independent component analysis; multichannel EEG; ocular artifact source; ocular source; Fractals; Electroencephalogram; Independent component analysis; eye blink artifact; fractal dimension;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering (ICEE), 2012 20th Iranian Conference on
  • Conference_Location
    Tehran
  • Print_ISBN
    978-1-4673-1149-6
  • Type

    conf

  • DOI
    10.1109/IranianCEE.2012.6292611
  • Filename
    6292611