Sapphire and rutile dielectric resonators for measurements of surface resistance of superconducting thin films

Author

Mazierska, Janina

Author_Institution

Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia

Volume

1

fYear

1997

fDate

2-5 Dec 1997

Firstpage

125

Abstract

Dielectric resonators are widely used for measurements of surface resistance of High Temperature Superconducting films for cellular and PCS filters. This paper discusses properties of two 10 GHz resonators; a sapphire Hakki-Coleman resonator and an open ended rutile resonator in terms of their suitability and accuracy for microwave characterisation of HTS films

Keywords

dielectric resonators; electric resistance measurement; high-temperature superconductors; microstrip filters; microwave filters; microwave measurement; superconducting microwave devices; superconducting thin films; 10 GHz; Hakki-Coleman resonator; PCS filters; TiO₂; cellular filters; dielectric resonators; high temperature superconducting films; microwave characterisation; open ended rutile resonator; superconducting thin films; surface resistance measurement; Copper; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; Equations; High temperature superconductors; Loss measurement; Superconducting films; Surface resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific

Print_ISBN

962-442-117-X

Type

conf

DOI

10.1109/APMC.1997.659321

Filename

659321