DocumentCode
3216096
Title
Nanomanipulation of 2 inch wafer fabrication of vertically aligned carbon nanotube arrays by nanoimprint lithography
Author
Bu, Ian Y Y
Author_Institution
Dept. of Microelectron. Eng., Nat. Kaohsiung Marine Univ., Kaohsiung, Taiwan
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
540
Lastpage
541
Abstract
In order to scale up CNT array fabrication to wafer scale, we propose here thermal nanoimprint lithography; the resolution is only limited by the stamp, and thus can approach that of the EBL, and the throughput is many orders of magnitude higher. The automation of nanohandling sequences using VACNTs grown by the NIL method paves the way for fast prototypic assembly of CNT-based devices [7]. For nanomanipulation, the advantages of such an ordered array, with well-defined positions for all the CNTs, is that once calibrated the manipulation system, can locate the CNT automatically. Another advantage is that the CNTs can be grown with high degree of uniformity across a large area. A single CNT can be picked up without possibility of interfering from other CNTs.
Keywords
automation; carbon nanotubes; electron beam lithography; nanolithography; soft lithography; C; NIL method; automation; carbon nanotube growth; carbon nanotube-based devices; electron beam lithography; nanohandling sequences; nanomanipulation; prototypic assembly; size 2 in; stamp; thermal nanoimprint lithography; vertically aligned carbon nanotube arrays; wafer fabrication; Arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644199
Filename
5644199
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