• DocumentCode
    3216096
  • Title

    Nanomanipulation of 2 inch wafer fabrication of vertically aligned carbon nanotube arrays by nanoimprint lithography

  • Author

    Bu, Ian Y Y

  • Author_Institution
    Dept. of Microelectron. Eng., Nat. Kaohsiung Marine Univ., Kaohsiung, Taiwan
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    540
  • Lastpage
    541
  • Abstract
    In order to scale up CNT array fabrication to wafer scale, we propose here thermal nanoimprint lithography; the resolution is only limited by the stamp, and thus can approach that of the EBL, and the throughput is many orders of magnitude higher. The automation of nanohandling sequences using VACNTs grown by the NIL method paves the way for fast prototypic assembly of CNT-based devices [7]. For nanomanipulation, the advantages of such an ordered array, with well-defined positions for all the CNTs, is that once calibrated the manipulation system, can locate the CNT automatically. Another advantage is that the CNTs can be grown with high degree of uniformity across a large area. A single CNT can be picked up without possibility of interfering from other CNTs.
  • Keywords
    automation; carbon nanotubes; electron beam lithography; nanolithography; soft lithography; C; NIL method; automation; carbon nanotube growth; carbon nanotube-based devices; electron beam lithography; nanohandling sequences; nanomanipulation; prototypic assembly; size 2 in; stamp; thermal nanoimprint lithography; vertically aligned carbon nanotube arrays; wafer fabrication; Arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644199
  • Filename
    5644199