Title :
Testing The Yield Of An Amplifier-discriminator Chip Fabricated In Tektronix SHPi
Author :
Rahn, J. ; Geller, D. ; Golden, D. ; Grillo, A. ; Sadrozinski, H.F.-W.
Author_Institution :
University of California
fDate :
31 Oct-6 Nov 1993
Keywords :
Calibration; Capacitors; Circuit testing; Electronic equipment testing; Power supplies; Probes; Pulse amplifiers; Pulse shaping methods; Signal generators; Threshold voltage;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
DOI :
10.1109/NSSMIC.1993.701704
