DocumentCode :
3216341
Title :
GOLDENGATE: a fast and accurate bridging fault simulator under a hybrid logic/I/sub DDQ/ testing environment
Author :
Tzuhao Chen ; Hajj, I.N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
1997
fDate :
9-13 Nov. 1997
Firstpage :
555
Lastpage :
561
Abstract :
In this paper we describe GOLDENGATE-a bridging fault simulator for cell-based digital VLSI circuits with the following features: 1. It targets both combinational and sequential circuits. 2. It simulates general (routing, adjacency, and intra-cell) realistic bridging faults efficiently through a table-based scheme. The pre-computed table contains accurate cell output voltage and I/sub DDQ/ values obtained through electrical-level simulations. 3. It simulates both feedback and nonfeedback bridging faults (BFs) efficiently through a cycling event-driven technique. 4. It allows mixed voltage and I/sub DDQ/ simulation to support a fully hybrid test scheme where mixed logic and I/sub DDQ/ sensings are allowed. The experimental results show that GOLDENGATE is both accurate and fast.
Keywords :
circuit analysis computing; combinational circuits; logic CAD; logic testing; sequential circuits; GOLDENGATE; bridging fault simulator; combinational circuits; digital VLSI circuits; electrical-level simulation; event-driven technique; logic/I/sub DDQ/ testing; sequential circuits; Sequential logic circuit testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1997. Digest of Technical Papers., 1997 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-8186-8200-0
Type :
conf
DOI :
10.1109/ICCAD.1997.643594
Filename :
643594
Link To Document :
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