DocumentCode :
3216416
Title :
Electromigration Issues in High Current Horn
Author :
Zhang, W. ; Bellavia, S. ; Sandberg, J. ; Simos, N. ; Tuozzolo, J. ; Weng, W-T. ; Hseuh, B.
Author_Institution :
Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
fYear :
2005
fDate :
16-20 May 2005
Firstpage :
3700
Lastpage :
3702
Abstract :
The secondary particle focusing horn for the AGS neutrino experiment proposal is a high current and high current density device. The peak current of horn is 300 kA. At the smallest area of horn, the current density is near 8 kA/mm2. At very high current density, a few kA/mm2, the electromigration phenomena will occur. Momentum transfer between electrons and metal atoms at high current density causes electromigration. The reliability and lifetime of focusing horn can be severely reduced by electromigration. In this paper, we discuss issues such as device reliability model, incubation time of electromigration, and lifetime of horn.
Keywords :
Current density; Electromigration; Frequency; Geometry; Laboratories; Neutrino sources; Physics; Pulse power systems; Skin; Thin wall structures;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN :
0-7803-8859-3
Type :
conf
DOI :
10.1109/PAC.2005.1591586
Filename :
1591586
Link To Document :
بازگشت