DocumentCode
3216416
Title
Electromigration Issues in High Current Horn
Author
Zhang, W. ; Bellavia, S. ; Sandberg, J. ; Simos, N. ; Tuozzolo, J. ; Weng, W-T. ; Hseuh, B.
Author_Institution
Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
fYear
2005
fDate
16-20 May 2005
Firstpage
3700
Lastpage
3702
Abstract
The secondary particle focusing horn for the AGS neutrino experiment proposal is a high current and high current density device. The peak current of horn is 300 kA. At the smallest area of horn, the current density is near 8 kA/mm2. At very high current density, a few kA/mm2, the electromigration phenomena will occur. Momentum transfer between electrons and metal atoms at high current density causes electromigration. The reliability and lifetime of focusing horn can be severely reduced by electromigration. In this paper, we discuss issues such as device reliability model, incubation time of electromigration, and lifetime of horn.
Keywords
Current density; Electromigration; Frequency; Geometry; Laboratories; Neutrino sources; Physics; Pulse power systems; Skin; Thin wall structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN
0-7803-8859-3
Type
conf
DOI
10.1109/PAC.2005.1591586
Filename
1591586
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