• DocumentCode
    3216416
  • Title

    Electromigration Issues in High Current Horn

  • Author

    Zhang, W. ; Bellavia, S. ; Sandberg, J. ; Simos, N. ; Tuozzolo, J. ; Weng, W-T. ; Hseuh, B.

  • Author_Institution
    Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    3700
  • Lastpage
    3702
  • Abstract
    The secondary particle focusing horn for the AGS neutrino experiment proposal is a high current and high current density device. The peak current of horn is 300 kA. At the smallest area of horn, the current density is near 8 kA/mm2. At very high current density, a few kA/mm2, the electromigration phenomena will occur. Momentum transfer between electrons and metal atoms at high current density causes electromigration. The reliability and lifetime of focusing horn can be severely reduced by electromigration. In this paper, we discuss issues such as device reliability model, incubation time of electromigration, and lifetime of horn.
  • Keywords
    Current density; Electromigration; Frequency; Geometry; Laboratories; Neutrino sources; Physics; Pulse power systems; Skin; Thin wall structures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1591586
  • Filename
    1591586