DocumentCode :
3216420
Title :
The effects of technological parameters on forsterite - Silicon carbide absorbing ceramics
Author :
Kong, D.H. ; Cheng Cai
Author_Institution :
Nanjing Sanle Electron. Inf. Ind. Group Co, Ltd., Nanjing, China
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
530
Lastpage :
531
Abstract :
In this paper, the findings on properties of multi-phases microwave attenuation materials of forsterite and silicon carbide were reported, and the effects of technological parameters of it have been studied.
Keywords :
absorption; ceramics; dielectric losses; electromagnetic waves; magnesium compounds; silicon compounds; surface hardening; wide band gap semiconductors; Mg2SiO4; SiC; ceramic carburizing; dielectric loss; forsterite; high-frequency electromagnetic waves; multiphase microwave attenuation materials; silicon carbide absorbing ceramics; technological parameters; traditional multiphase materials; Ceramics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644213
Filename :
5644213
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3216420
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