• DocumentCode
    3216420
  • Title

    The effects of technological parameters on forsterite - Silicon carbide absorbing ceramics

  • Author

    Kong, D.H. ; Cheng Cai

  • Author_Institution
    Nanjing Sanle Electron. Inf. Ind. Group Co, Ltd., Nanjing, China
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    530
  • Lastpage
    531
  • Abstract
    In this paper, the findings on properties of multi-phases microwave attenuation materials of forsterite and silicon carbide were reported, and the effects of technological parameters of it have been studied.
  • Keywords
    absorption; ceramics; dielectric losses; electromagnetic waves; magnesium compounds; silicon compounds; surface hardening; wide band gap semiconductors; Mg2SiO4; SiC; ceramic carburizing; dielectric loss; forsterite; high-frequency electromagnetic waves; multiphase microwave attenuation materials; silicon carbide absorbing ceramics; technological parameters; traditional multiphase materials; Ceramics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644213
  • Filename
    5644213
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3216420