DocumentCode :
3216537
Title :
Cold-test characteristics simulation of a v-type microstrip meander-line slow wave structure
Author :
Fei Shen ; Yan-yu Wei ; Zhao-yun Duan ; Wen-xiang Wang ; Yu-bin Gong
Author_Institution :
Vacuum Electron. Nat. Lab., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
288
Lastpage :
289
Abstract :
In this paper, a novel v-type microstrip meander-line slow wave structure (MMSWS) is presented. With the electromagnetic simulation software HFSS, the comparisons of the dispersion characteristic and coupling impedance between the novel and traditional MMSWS are given. Then the cold-test characteristics of the v-type structure for different parameters are calculated. Also, the structure supported by dielectric slab is analyzed. The results demonstrate that the v-type structure has a better performance than the traditional in both bandwidth and coupling impedance, while the structure supported by dielectric slab has an even better performance than the former.
Keywords :
dispersion (wave); microstrip lines; slow wave structures; HFSS electromagnetic simulation software; V-type microstrip meander-line slow wave structure; cold-test characteristics simulation; coupling impedance; dielectric slab; dispersion characteristic; Dispersion; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644218
Filename :
5644218
Link To Document :
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