• DocumentCode
    3216660
  • Title

    Time-to-failure tree

  • Author

    Ejlali, Alireza ; Miremadi, Seyyed Ghasem

  • Author_Institution
    Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    148
  • Lastpage
    152
  • Abstract
    The reliability analysis of critical systems is often performed using fault tree analysis. Fault trees are analyzed using analytic approaches or Monte Carlo simulation. The usage of the analytic approaches is limited in few models and certain kinds of parameter distributions. In contrast to the analytic approaches, Monte Carlo simulation can be broadly used. However, Monte Carlo simulation is time-consuming because of the intensive computation. In this paper, a new model is presented which is called time-to-failure tree. Static and dynamic fault trees can be easily transformed into time-to-failure trees. In fact, each time-to-failure tree is a digital circuit, which can be synthesized to a field programmable gate array (FPGA). Therefore, Monte Carlo simulation can be significantly accelerated using FPGAs.
  • Keywords
    fault trees; field programmable gate arrays; reliability; FPGA; Monte Carlo simulation; critical systems; digital circuit; dynamic fault trees; fault tree analysis; field programmable gate array; parameter distributions; reliability analysis; static fault trees; time-to-failure tree; Acceleration; Analytical models; Circuit synthesis; Computational modeling; Digital circuits; Failure analysis; Fault trees; Field programmable gate arrays; Humans; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2003. Annual
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-7717-6
  • Type

    conf

  • DOI
    10.1109/RAMS.2003.1181917
  • Filename
    1181917