DocumentCode
3216660
Title
Time-to-failure tree
Author
Ejlali, Alireza ; Miremadi, Seyyed Ghasem
Author_Institution
Sharif Univ. of Technol., Tehran, Iran
fYear
2003
fDate
2003
Firstpage
148
Lastpage
152
Abstract
The reliability analysis of critical systems is often performed using fault tree analysis. Fault trees are analyzed using analytic approaches or Monte Carlo simulation. The usage of the analytic approaches is limited in few models and certain kinds of parameter distributions. In contrast to the analytic approaches, Monte Carlo simulation can be broadly used. However, Monte Carlo simulation is time-consuming because of the intensive computation. In this paper, a new model is presented which is called time-to-failure tree. Static and dynamic fault trees can be easily transformed into time-to-failure trees. In fact, each time-to-failure tree is a digital circuit, which can be synthesized to a field programmable gate array (FPGA). Therefore, Monte Carlo simulation can be significantly accelerated using FPGAs.
Keywords
fault trees; field programmable gate arrays; reliability; FPGA; Monte Carlo simulation; critical systems; digital circuit; dynamic fault trees; fault tree analysis; field programmable gate array; parameter distributions; reliability analysis; static fault trees; time-to-failure tree; Acceleration; Analytical models; Circuit synthesis; Computational modeling; Digital circuits; Failure analysis; Fault trees; Field programmable gate arrays; Humans; Performance analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2003. Annual
ISSN
0149-144X
Print_ISBN
0-7803-7717-6
Type
conf
DOI
10.1109/RAMS.2003.1181917
Filename
1181917
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