DocumentCode
3216802
Title
Laser reconfiguration for yield enhancement of a 16.6 cm2 monolithic multiprocessor system
Author
Schröder, Hans-Ulrich ; Hillmann-Ruge, Thomas ; Otterstedt, Jan
Author_Institution
Lab. fur Informationstechnol., Hannover Univ., Germany
fYear
1996
fDate
9-11 Oct 1996
Firstpage
104
Lastpage
112
Abstract
A 16.6 cm2 monolithic large area integrated multiprocessor system comprising 9 identical programmable video signal processing elements was reconfigured by excimer laser formed connections and discontinuities of conductor lines in a redundant bus system. The yield enhancement of functional processors amounts to 13.3%. On two prototypes, the laser reconfiguration of the bus system led to 4 functional processors per chip at 66 MHz, providing a peak arithmetic performance of 4 GOPS per multiprocessor system. The power supply to defective processors with a high stand-by power consumption was terminated by laser, leading to a halving of power consumption. Furthermore, for the improvement of the laser process, vertical links between two metallization levels were formed on two chips with different standard CMOS layer sequences on special test structures. For the yield statistics of the formed vertical links, a contact resistance RK >3 Ω was treated as a failure. With the laser processing of vertical links with an area of 14×14 μm2, a yield of 100% has been achieved. Beyond those, conventional accelerated life time tests were performed to examine the reliability of laser formed vertical links. An extrapolation of Black´s equation to operating conditions (100°C, 2.5 mA) resulted in a failure rate of 0.1% in 39 years
Keywords
CMOS digital integrated circuits; computer testing; contact resistance; digital signal processing chips; integrated circuit testing; integrated circuit yield; laser materials processing; life testing; multiprocessing systems; video signal processing; 100 degC; 2.5 mA; 66 MHz; Black´s equation; accelerated life time tests; conductor line discontinuities; contact resistance; excimer laser formed connections; failure rate; formed vertical links; laser reconfiguration; monolithic multiprocessor system; operating conditions; peak arithmetic performance; power consumption; programmable video signal processing elements; redundant bus system; stand-by power consumption; standard CMOS layer sequences; test structures; vertical links; yield enhancement; yield statistics; Arithmetic; CMOS process; Conductors; Emergency power supplies; Energy consumption; Metallization; Multiprocessing systems; Power lasers; Prototypes; Video signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Innovative Systems in Silicon, 1996. Proceedings., Eighth Annual IEEE International Conference on
Conference_Location
Austin, TX
ISSN
1063-2204
Print_ISBN
0-7803-3639-9
Type
conf
DOI
10.1109/ICISS.1996.552417
Filename
552417
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