• DocumentCode
    3216802
  • Title

    Laser reconfiguration for yield enhancement of a 16.6 cm2 monolithic multiprocessor system

  • Author

    Schröder, Hans-Ulrich ; Hillmann-Ruge, Thomas ; Otterstedt, Jan

  • Author_Institution
    Lab. fur Informationstechnol., Hannover Univ., Germany
  • fYear
    1996
  • fDate
    9-11 Oct 1996
  • Firstpage
    104
  • Lastpage
    112
  • Abstract
    A 16.6 cm2 monolithic large area integrated multiprocessor system comprising 9 identical programmable video signal processing elements was reconfigured by excimer laser formed connections and discontinuities of conductor lines in a redundant bus system. The yield enhancement of functional processors amounts to 13.3%. On two prototypes, the laser reconfiguration of the bus system led to 4 functional processors per chip at 66 MHz, providing a peak arithmetic performance of 4 GOPS per multiprocessor system. The power supply to defective processors with a high stand-by power consumption was terminated by laser, leading to a halving of power consumption. Furthermore, for the improvement of the laser process, vertical links between two metallization levels were formed on two chips with different standard CMOS layer sequences on special test structures. For the yield statistics of the formed vertical links, a contact resistance RK >3 Ω was treated as a failure. With the laser processing of vertical links with an area of 14×14 μm2, a yield of 100% has been achieved. Beyond those, conventional accelerated life time tests were performed to examine the reliability of laser formed vertical links. An extrapolation of Black´s equation to operating conditions (100°C, 2.5 mA) resulted in a failure rate of 0.1% in 39 years
  • Keywords
    CMOS digital integrated circuits; computer testing; contact resistance; digital signal processing chips; integrated circuit testing; integrated circuit yield; laser materials processing; life testing; multiprocessing systems; video signal processing; 100 degC; 2.5 mA; 66 MHz; Black´s equation; accelerated life time tests; conductor line discontinuities; contact resistance; excimer laser formed connections; failure rate; formed vertical links; laser reconfiguration; monolithic multiprocessor system; operating conditions; peak arithmetic performance; power consumption; programmable video signal processing elements; redundant bus system; stand-by power consumption; standard CMOS layer sequences; test structures; vertical links; yield enhancement; yield statistics; Arithmetic; CMOS process; Conductors; Emergency power supplies; Energy consumption; Metallization; Multiprocessing systems; Power lasers; Prototypes; Video signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Systems in Silicon, 1996. Proceedings., Eighth Annual IEEE International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-2204
  • Print_ISBN
    0-7803-3639-9
  • Type

    conf

  • DOI
    10.1109/ICISS.1996.552417
  • Filename
    552417