DocumentCode :
3216918
Title :
Electron-phonon and electron-defect scattering rates in semiconducting zigzag carbon nanotubes
Author :
Thiagarajan, K. ; Lindefelt, U.
Author_Institution :
Dept. of Inf. Technol. & Media, Mid Sweden Univ., Sundsvall, Sweden
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
282
Lastpage :
283
Abstract :
The electron transport properties of single walled carbon nanotubes are of fundamental importance for the development of carbon based nanotechnology. Carbon nanotubes can display both chemical and structural defects, which affect electronic states near the Fermi level. This is further complicated by the fact that the concentration of defects depends upon the method of synthesis. In this work, we have investigated both electron-phonon and electron-defect scattering in semiconducting zigzag carbon nanotubes by calculating and analyzing the quantum-mechanical scattering rates for these processes. One objective of this work is to give a theoretical limit for the concentration of defects at which electron-defect scattering rates would be comparable to the electron-phonon scattering rates.
Keywords :
carbon nanotubes; electron-phonon interactions; elemental semiconductors; quantum theory; semiconductor nanotubes; C; Fermi level; carbon based nanotechnology; chemical defect; defect concentration; electron transport properties; electron-defect scattering rate; electron-phonon scattering rate; electronic states; quantum-mechanical scattering rates; semiconducting zigzag carbon nanotubes; single walled carbon nanotubes; structural defect; Electron tubes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644235
Filename :
5644235
Link To Document :
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