DocumentCode :
3216966
Title :
A 16.6 cm2 large area integrated circuit consisting of 9 video signal processors
Author :
Otterstedt, Jan ; Kuboschek, Martin ; Castagne, Jens ; Mucha, Joachim
Author_Institution :
Lab. fur Informationstechnol., Hannover Univ., Germany
fYear :
1996
fDate :
9-11 Oct 1996
Firstpage :
113
Lastpage :
123
Abstract :
In this paper we introduce a large area integrated circuit (LAIC) called MAXPE9 which integrates 9 programmable video signal processing elements (PEs) on an area of 16.6 cm2. Each PE has a peak arithmetic performance of 1 giga operations per second (GOPS). Due to yield considerations redundancy concepts have been implemented that even in the presence of production defects result in working chips utilizing a lower number of PEs. Each PE has built in self-test (BIST) capabilities which allow for an independent test of itself under the control of its integrated fault-tolerant BIST controller. Defective PEs are switched off. Only the PEs passing the BIST are used for video processing tasks. Furthermore, the global input and output buses can be reconfigured using arrays of laser fuses and laser links, thus circumventing defects which are otherwise lethal for the complete chip. Prototypes have been fabricated in a 0.8 μm CMOS process structured by masks using wafer stepping with overlapping exposures. Employing the redundancy, on these prototypes up to 6 PEs per chip were functional at 66 MHz, thus providing a peak arithmetic performance of up to 6 GOPS per chip for video coding tasks (like H.261, MPEG-1 and MPEG-2)
Keywords :
CMOS digital integrated circuits; built-in self test; digital signal processing chips; fault tolerant computing; integrated circuit yield; redundancy; video coding; 0.8 micron; 66 MHz; CMOS process; H.261; MAXPE9; MPEG-1; MPEG-2; built in self-test; global input; global output; integrated fault-tolerant BIST controller; large area integrated circuit; laser fuses; overlapping exposures; peak arithmetic performance; redundancy concepts; video coding; video signal processors; wafer stepping; yield considerations; Arithmetic; Automatic testing; Built-in self-test; Fault tolerance; Integrated circuit yield; Optical arrays; Production; Prototypes; Redundancy; Video signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Systems in Silicon, 1996. Proceedings., Eighth Annual IEEE International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-2204
Print_ISBN :
0-7803-3639-9
Type :
conf
DOI :
10.1109/ICISS.1996.552418
Filename :
552418
Link To Document :
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